Functional Testing FCT

Date:

The controller interfaces with the modular instruments through FPGA to generate input/output signals. Functional parameters of the device under test (DUT), including voltage, current, waveform, load capacity, chip programming, data transmission, and data reading/writing, are measured and tested by delivering the input signals and analyzing the output signals. 

The embedded instrument platform is expertly designed for automated production line testing, streamlining the function testing process and enhancing production efficiency. The platform features a compact product controller module equipped with a built-in SOC and is based on the robust architecture of FPGA + ARM. It supports a variety of I/O channels and control interfaces, and supports connection to high-speed signals via Ethernet. The platform is also outfitted with embedded instrument modules and IP libraries, enabling seamless integration and control of multiple instruments and complex functions such as digital multimeters, signal generators, data recorders, audio analyzers, and electronic loads.

Contact Us

Smartgiant Technology 1800 Wyatt Dr, Unit 3, Santa Clara, CA 95054.

Email: info@smartgiant.com

1

Contact Us

Smartgiant Technology 1800 Wyatt Dr, Unit 3, Santa Clara, CA 95054.

Email: info@smartgiant.com

1